Web-Materials

About the Editors

Safa Kasap

Safa Kasap is currently a Professor and Canada Research Chair in Electronic Materials and Devices in the Electrical Engineering Department at the University of Saskatchewan, Canada. He obtained his Ph.D. degree from the Imperial College of Science, Technology and Medicine, University of London, specializing in amorphous semiconductors and chalcogenide glasses. In 1996 he was awarded the DSc (Engineering) from London University for his research contributions to materials science in electrical engineering. He is a Fellow of the Institution of Electrical Engineers, the Institute of Physics and the Institute of Materials.

Peter Capper

Peter Capper has spent some 30 years in the infrared industry growing and characterising cadmium mercury telluride (CMT) and other tellerium-based materials. He holds a patent in the bulk growth of CMT, has authored/co-authored over 100 papers and given several invited talks at international crystal grwoth/IR conferences. Dr. Capper is also a Fellow of the Institute of Physics. He has edited/ co-edited 5 books in IR materials and devices and crystal growth. He is now Materials Team Leader at SELEX Sensors and Airborne Systems, Southampton, UK.

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List of Selected Authors

Sado Adachi, Gunma University, Gunma, Japan

Alf Adams, University of Surry, UK

Guy Adriaenssens, Kathokieke Universiteit Leuven, Heverlee-Leuven, Belgium

Wilford von Ammon, Siltronic AG, Burghausen, Germany

Peter Ashburn University of Southampton, UK

Mark Auslender, Ben-Gurion University, Beer-Sheva, Israel

Darren Bagnall, University of Southampton, UK

Ian Baker, SELEX Sensors and Airborne Systems, Southampton, UK

Sergei Baranovskii, Philipps University, Malburg, Germany

Mark Baxendale, Queen Mary University of London, UK

Monica Brinza, Katholieke Univeriteit Leuven, Heverlee-Leuven, Belgium

Paul Brown, University of Nottingham, UK

Mike Brozel, UMIST, Manchester, UK

Peter Capper, SELEX Sensors and Airborne Systems, Southampton, UK

Lawrence Comstock, San Jose State University, San Jose, USA

Ray DeCorby, University of Alberta, Canada

Jamal Deen, McMaster University, Canada

Len Dissado, Univeristy of Leicester, UK

Lester Eastman, Cornell University, Ithaca, NY, USA

Anyd Edgar, Victoria University, Wellington, New Zealand

Darrel Frear, Freescale Semiconductor, Tempe, USA

Mark Fox, University of Sheffield, UK

Brian Foutz, Cornell University, Ithaca, NY, USA

Robert Gould, Keele University, UK

Aseel Hassan, Sheffield-Halam University, UK

Shlomo Hava, Ben-Gurion University, Beer-Sheva Israel

Colin Humphrey, University of Cambridge, UK

Stuart Irvine, University of Wales, Bangor, UK

Radu Ispasoiu, Credence Corporation

Minoru Isshiki, Tohoku University, Japan

Robert Johanson, University of Saskatchewan, Canada

Zahangir, Kabir, Concordia University, Montreal, Canada

Safa Kasap, University of Saskatchewan, Canada

Alex Kolobov, Institute for Advanced Industrial Science and Technology, Ibaraki, Japan

Cyril Koughia, University of Saskatchewan, Canada

Geoffrey Luckhurst, Southampton University, UK

Arokia Nathan, University of Waterloo, Canada and Cambridge University, UK

Winfred Monch, Gerhard-Mercator-Universitat Duisberg, Germany

Kazuo Morigaki, Yamaguchi University, Hiroshima, Japan

Hadis Morkoc, Virginia Commonwealth University, Richmond, USA

Gertrude Newmark, Columbia University, New York, USA

Chisato Ogihara, yamaguchi University, Hiroshima, Japan

Stephen O'Leary, University of Regina, Canada

Fabien Pascal, Univerite de Montpellier, France

Mike Petty, University of Durham, UK

Asim Ray, Queen Mary London University, Uk

John Rowlands, University of Toronto, Canada

Harry Ruda, University of Toronto, Canada

Kejy Tanaka Keiji, Hokkaido university, Sapporo, Japan

Charbel Tannous, universite de Bretagne Occidentale, Brest, Frace

Ali Teke, Balikesir University, Turkey

Dan Tonchev, University of Saskatchewan, Canada

J. Tominaga, Institute for Advanced Industrial Science and Technology, Ibaraki, Japan

Harry Tuller, Massachusetts Institute of Technology, Cambridge, USA

Ted Sargent, University of Toronto, Canada

Peyman Servati, University of Waterloo and University of Cambridge, UK

Derek Shaw, University of Hull, UK

Michael Shur, Rensselaer Polytechnic Institute Troy, New York, USA

Fumio Shimura, Shizuoka Institute of Science and Technology, Shizuoka, Japan

Jai Singh, Charles Darwin University, Australia

Tim Smeeton, University of Cambridge, UK

Stephen Sweeney, University of Surrey, UK

David Sykes, Loughborough Surface Analysis Ltd, Leicestershire, UK

Robert Wallace, University of Texas, Dallas, USA

David Weisss, NexPress Soutions Inc., Rochester, USA

Rainer Wesche, CRPP-FT, Paul Scherrer Institute, Switzerland

Roger Whatmore, Tyndall National Institute, Cork, Ireland

Neil White, Universtiy of Southampton, UK

Jan Willekens, katholieke Universiteit Leuven, Hevelee-Leuven, Belgium

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Table of Contents

Perspective on Electronic and Optoelectronic Materials

Electrical Conduction in Metals and Semiconductors

Optical properties of Electronic Materials: Fundamentals & Characterization

Magnetic Properties of Electronic Materials

Defects in Monocrystalline Silicon

Diffusion in Semiconductors

Photoconductivity in Materials Research

Electronic Properties of Semiconductor Interfaces

Disordered Materials

Dielectric Response

Ionic Conduction and Applications

Bulk crystal growth-methods and materials

Single-Crystal Silicon: Growth and Properties

Epitaxial Crystal Growth: Methods and Materials

Narrow-Bandgap II-VI Semiconductors: Growth and Properties

Structural Characterization

Surface Chemical Analysis

Thermal Properties and Thermal Analysis: Fundamentals, Experimental Techniques and Applications

Electrical Characterization of Semiconductors Materials and Devices

Single Crystal Silicon: Electrical and Optical Properties

Silicon-Germanium: Properties, Growth and Applications

High-Temperature Electronic Materials: Silicon Carbide and Diamond

Amorphous and Microcrystalline Silicon

Ferroelectric Materials

Dielectric Materials for Microelectronics

Thin Films

Thick Films

III-V Ternary and Quaternary Compounds

Group III Nitrides

Electron Transport within the III-V Nitride Semiconductors, GaN, AIN, and InN: Monte Carlo Analysis

II-IV Semiconductor for Optoelectronics: CdS, CdSe, CdTe

Doping Aspects of Zn-Based Wide-Bandgap Semiconductors for Optoelectronics

II-VI Narrow Band-gap

Optoelectronic Devices and Materials

Liquid Crystals

Organic Photoconductors

Luminescent Materials

Nano-Engineered Tunable Photonic Crystals in the Near-IR and Visible Electromagnetic Spectrum

Quantum Wells, Superlattices and Band-gap Engineering

Glasses for Photonic Integration

Optical Nonlinearity in Photonic Glasses

Solar Cells & Photovoltaics

Silicon on Mechanically Flexible Substrates

Large-Area Electronics

Photoconductors for X-Ray Image Detectros

Phase-Change Optical Recording (from Basic Principles to Advanced Applications)

Carbon Nanotubes & Bucky Materials

Magnetic Information-Storage Materials

High Temperature Superconductors

Molecular Electronics

Organic Materials for Chemical Sensing

Packaging Materials

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